| SNo |
IS Number |
Title |
Technical Committee |
|
1 |
IS 12032 : Part 5 : 1993 |
Graphical symbols for diagrams in the field of electrotechnology: Part 5 semiconductors and electron tubes |
LITD 5 |
|
2 |
IS 12032 : Part 6 : 1987 |
Graphical symbols for diagrams in the field of electrotechnology: Part 6 production and conversion of electrical energy |
ETD 1 |
|
3 |
IS 12032 : Part 8 : 1987 |
Graphical symbols for diagrams in the field of electrotechnology: Part 8 measuring instruments, lamps and signalling devices |
ETD 1 |
|
4 |
IS 12032 : Part 9 : 1993 |
Graphical symbols for diagrams in the field of electrotechnology: Part 9 telecommunications: switching and peripheral equipment |
LITD 13 |
|
5 |
IS 12032 : Part 10 : 1991 |
Graphical Symbols for Diagrams in the Field of Electrotechnology: Part 10 Telecommunications: Transmission (under Print) |
ETD 1 |
|
6 |
IS 12032 : Part 11 : 1987 |
Graphical symbols for diagrams in the field of electrotechnology: Part 11 architectural and topographical installation plan and diagrams |
ETD 1 |
|
7 |
IS 12032 : Part 12 : 1994 |
Graphical symbols for diagrams in the field of electrotechnology: Part 12 binary logic elements |
LITD 5 |
|
8 |
IS 12032 : Part 13 : 1992 |
Graphical symbols for diagrams in the field of electrotechnology: Part 13 analogue elements |
LITD 5 |
|
9 |
IS 12032 : Part 7 : 1987 |
Graphical symbols for diagrams in the field of electrotechnology: Part 7 switchgear, controlgear and protective devices |
ETD 1 |
|
10 |
IS 14901 : Part 1 : 2010 |
Semiconductor devices - Discrete devices and integrated circuits: Part 1 general (First Revision) |
LITD 5 |
|
11 |
IS 14901 : Part 5 : 2004 |
Semiconductor devices - Discrete devices and integrated circuits: Part 5 optoelectronic devices |
LITD 5 |
|
12 |
IS 12970 : Part 1 : 2010 |
Semiconductor devices integrated circuits: Part 1 general |
LITD 5 |
|
13 |
IS 12970 : Part 2 : Sec 1 : 1992 |
Semiconductor devices - Integrated circuits: Part 2 digital integrated circuits - Essential rating and characteristics: Sec 1 general |
LITD 5 |
|
14 |
IS 12970 : Part 2 : Sec 2 : 1992 |
Semiconductor devicesintegrated circuits: Part 2 digital integrated circuits - Essential ratings and characteristics: Sec 2 integrated circuit memories |
LITD 5 |
|
15 |
IS 12970 : Part 2 : Sec 3 : 1993 |
Semiconductordevices - Integrated circuits: Part 2 digital integrated circuits - Essential rating and characteristics: Sec 3 integrated circuit microprocessors |
LITD 5 |
|
16 |
IS 12970 : Part 3 : Sec 1 : 1992 |
Semiconductor devices - Integrated circuits: Part 3 digital integrated circuits - Measuring methods: Sec 1 general |
LITD 5 |
|
17 |
IS 12970 : Part 3 : Sec 2 : 1992 |
Semkonductor devices integrated circuits: Part 3 digital integrated circuits - Measuring methods: Sec 2 static characteristics |
LITD 5 |
|
18 |
IS 12970 : Part 3 : Sec 3 : 1993 |
Semiconductor devices - Integrated circuits: Part 3 digital integrated circuits - Measuring methods: Sec 3 dynamic measurements |
LITD 5 |
|
19 |
IS 12970 : Part 5 : Sec 1 : 1991 |
Semiconductor devices integrated circuits: Part 5 analogue integrated circuits essential ratings and characteristics: Sec 1 general format |
LITD 5 |
|
20 |
IS 12970 : Part 5 : Sec 2 : 1992 |
Semiconductor devices integrated circuits: Part 5 analogue integrated circuits - Essential ratings and characteristics: Sec 2 operational amplifiers |
LITD 5 |
|
21 |
IS 12970 : Part 5 : Sec 3 : 1992 |
Semiconductor devices - Integrated circuits: Part 5 analogue integrated circuits - Essential ratings and characteristics: Sec 3 audio amplifiers, video amplifiers and multichannel amplifiers for telecommunications |
LITD 5 |
|
22 |
IS 12970 : Part 5 : Sec 4 : 1992 |
Semiconductor devices - 1ntegrate.d circuits: Part 5 analogue integrated circuits - essential ratings and characteristics: Sec 4 R.F. and I.F. amplifiers |
LITD 5 |
|
23 |
IS 12970 : Part 5 : Sec 5 : 1993 |
Semiconductor devices - Integrated circuits: Part 5 analogue integrated circuits - Essential ratings and characteristics: Sec 5 voltage and current regulators |
LITD 5 |
|
24 |
IS 12970 : Part 5 : Sec 6 : 1993 |
Semiconductordevices - Integrated circuits: Part 5 analogue lNtegrated circuits - Essential ratings and characteristics: Sec 6 analogue signal switching circuits |
LITD 5 |
|
25 |
IS 12970 : Part 6 : Sec 1 : 1992 |
Semiconductor devices - Integrated circuits: Part 6 analogue integrated circuits, measuring methods: Sec 1 general |
LITD 5 |
|
26 |
IS 12970 : Part 6 : Sec 2 : 1992 |
Semiconductor devices - Integrated circuits: Part 6 analogue integrated circuits, measuring methods: Sec 2 linear amplifiers |
LITD 5 |
|
27 |
IS 12970 : Part 6 : Sec 3 : 1992 |
SemicOnductor devices integrated circuits: Part 6 analogue integrated circuits measuring methods: Sec 3 voltage regulators |
LITD 5 |
|
28 |
IS 12970 : Part 6 : Sec 4 : 1992 |
Semiconductor devices - Integrated circuits: Part 6 analogue integrated circuits - Measuring methods: Sec 4 analogue signal switching circuits |
LITD 5 |
|
29 |
IS 12641 : 2004 |
Semiconductor devices - Mechanical and climatic test methods (First Revision) |
LITD 5 |
|
30 |
IS 15934 : PART 5 : 2011 |
Liquid crystal and solid - State display devices: Part 5 environmental, endurance and mechanical test methods |
LITD 4 |
|
31 |
IS 10005 : 1994 |
SI Units and Recommendations for the Use of their Multiples and of Certain Other Units |
PGD 1 |
|
32 |
IS 8000 : Part 1 : 2019 |
Geometrical product specifications (GPS) -- Geometrical tolerancing: Part 1 Tolerances of form, orientation, location and run-out (Second Revision) |
PGD 24 |
|
33 |
IS 2500 : Part 1 : 2000 |
Sampling procedures for inspection by attributes: Part 1 sampling schemes indexed by acceptance quality limit (AQL) for lot - By - Lot inspection (Third Revision) |
MSD 3 |
|
34 |
IS 2500 : Part 2 : 1965 |
Sampling inspection procedures: Part 2 inspection by variables for percent defective |
MSD 3 |
|
35 |
IS 2500 : Part 3 : 1995 |
Sampling inspection procedures: Part 3 attribute sampling plans indexed by limiting quality (LQ) for isolated lot inspection iso title sampling procedures for inspection by attributes: Part 2 sampling pians indexed by limiting quality (LQ) for isolated lot inspection |
MSD 3 |
|
36 |
IS 2500 : Part 4 : 2014 |
Sampling procedures for inspection by attributes: Part 4 skip - Lot sampling procedures |
MSD 3 |
|
37 |
IS 2500 : Part 6 : 2014 |
Sampling procedures for inspection by attributes: Part 6 system of sequential sampling plans indexed by acceptance quality limit (AQL) for lot - By - Lot inspection |
MSD 3 |
|
38 |
IS 1002 : 1956 |
Multipurpose Grease, No. 1, No. 2 and No. 3 |
PCD 3 |
