IS Number : | IS 12641 : 2004 IEC 60749: 2002 Reviewed In : 2018 |
---|---|
IS Title [Eng-Hn] : | Semiconductor devices - Mechanical and climatic test methods (First Revision) |
No of Revision : | 1 |
No of Amendments : | 0 |
Technical Department : | Electronics and Information Technology Department |
Technical Committee : | LITD 5 ( Semiconductor And Other Electronic Components And Devices ) |
Language : | English |
Group : | Electronic and Telecom equipments, components and devices |
---|---|
Sub Group: | Electronic components and devices |
Sub Sub Group : | Electronic components |
Aspects: | Methods of tests |
Certification: | None |
Ministry : | |
Short Commom Man's Title: | Semiconductor Devices - Mechanical and Climatic Test Methods |
Itchs: | N/A |
Degree of Equivalence: | Identical under dual numbering |
Identical/Equivalent Standards: | IEC 60749: 2002 |
Organisation : |
Indian Standards Refered In IS IS 12641 : 2004 : |
|
||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
International Standards Refered In IS 12641 : 2004 | Standard contains no Cross Referenced International Standard. | ||||||||||||||||
IS 12641 : 2004 is Refered in following Indian Standards : |
|