SNo |
IS Number |
Title |
Technical Committee |
1 |
IS 12448 : Part 1 : 1988 |
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 1 general |
LITD 3 |
2 |
IS 12448 : Part 2 : Sec 1 : 1988 |
Basic testing procedures and measuring methods for electrotechnical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 1 general examination |
LITD 3 |
3 |
IS 12448 : Part 2 : Sec 2 : 1988 |
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 2 electrical continuity and contact resistance tests |
LITD 3 |
4 |
IS 12448 : Part 2 : Sec 3 : 1988 |
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 3 insulation tests |
LITD 3 |
5 |
IS 12448 : Part 2 : Sec 4 : 1988 |
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 4 voltage stress tests |
LITD 3 |
6 |
IS 12448 : Part 3 : 1989 |
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 3 current - Carrying capacity tests |
LITD 3 |
7 |
IS 12448 : Part 6 : 1991 |
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 6 climatic tests and soldering tests |
LITD 3 |