SNo |
IS Number |
Title |
Technical Committee |
1 |
IS 2500 : Part 1 : 2000 |
Sampling procedures for inspection by attributes: Part 1 sampling schemes indexed by acceptance quality limit (AQL) for lot - By - Lot inspection (Third Revision) |
MSD 3 |
2 |
IS 10673 : 1983 |
Sampling plans and procedures for inspection by attributes for electronic items |
LITD 2 |
3 |
IS 12641 : 2004 |
Semiconductor devices - Mechanical and climatic test methods (First Revision) |
LITD 5 |
4 |
IS 12970 : Part 1 : 2010 |
Semiconductor devices integrated circuits: Part 1 general |
LITD 5 |
5 |
IS 14901 : Part 1 : 2010 |
Semiconductor devices - Discrete devices and integrated circuits: Part 1 general (First Revision) |
LITD 5 |
6 |
IS 15934 : PART 5 : 2011 |
Liquid crystal and solid - State display devices: Part 5 environmental, endurance and mechanical test methods |
LITD 4 |
7 |
IS 15934 : Part 10 : Sec 1 : 2016 |
Liquid crystal display devices: Part 10 environmental, endurance and mechanical test methods: Sec 1 mechanical |
LITD 4 |