SNo |
IS Number |
Title |
Technical Committee |
1 |
IS 10673 : 1983 |
Sampling plans and procedures for inspection by attributes for electronic items |
LITD 2 |
2 |
IS 14901 : Part 1 : 2010 |
Semiconductor devices - Discrete devices and integrated circuits: Part 1 general (First Revision) |
LITD 5 |
3 |
IS 2500 : Part 1 : 2000 |
Sampling procedures for inspection by attributes: Part 1 sampling schemes indexed by acceptance quality limit (AQL) for lot - By - Lot inspection (Third Revision) |
MSD 3 |
4 |
IS 2500 : Part 3 : 1995 |
Sampling inspection procedures: Part 3 attribute sampling plans indexed by limiting quality (LQ) for isolated lot inspection iso title sampling procedures for inspection by attributes: Part 2 sampling pians indexed by limiting quality (LQ) for isolated lot inspection |
MSD 3 |
5 |
IS/QC 001002 : PART 1 : 2000 |
IEC quality assessment system for electronic components (IECQ) - Rules of procedure: Part 1 administration (First Revision) |
LITD 5 |