SNo |
IS Number |
Title |
Technical Committee |
1 |
IS 9000 : Part 1 : 1988 |
Basic environmental testing procedures for electronic and electrical items: Part 1 general (First Revision) |
LITD 1 |
2 |
IS 9000 : Part 3 : Sec 1 to 5 : 1977 |
Basic environmental testing procedures for electronic and electrical items: Part 3 dry heat test |
LITD 1 |
3 |
IS 9000 : Part 14 : Sec 1 to 3 : 1988 |
Basic environmental testing procedures for electronic and electrical items:Part 14 test n:change of temperature (First Revision) |
LITD 1 |
4 |
IS 9000 : Part 18 : Sec 1 to 3 : 1981 |
Basic environmental testing procedures for electronic and electrical items: Part 18 solderABility test |
LITD 5 |
5 |
IS 9000 : Part 19 : Sec 1 to 5 : 1986 |
Basic environmental testing procedures for electronic and electrical items: Part 19 test u: robustness of terminations and integral mounting devices (First Revision) |
LITD 5 |
6 |
IS 9000 : Part 7 : Sec 1 : 2018 |
Basic environmental testing procedures for electronic and electrical items: Part 7 impact test: Sec 1 shock (Test Ea) (Second Revision) |
LITD 1 |
7 |
IS 9000 : Part 5 : Sec 1 AND 2 : 1981 |
Basic environmental testing procedures for electronic and electrical items: Part 5 damp heat (Cyclic) test |
LITD 1 |
8 |
IS 9000 : Part 6 : 1978 |
Basic environmental testing procedures for electronic and electrical items: Part 6 composite temperature/humidity cyclic test |
LITD 1 |
9 |
IS 14901 : Part 1 : 2010 |
Semiconductor devices - Discrete devices and integrated circuits: Part 1 general (First Revision) |
LITD 5 |
10 |
IS 14901 : Part 5 : 2004 |
Semiconductor devices - Discrete devices and integrated circuits: Part 5 optoelectronic devices |
LITD 5 |
11 |
IS 12641 : 2004 |
Semiconductor devices - Mechanical and climatic test methods (First Revision) |
LITD 5 |