| IS Number : | IS 9470 : 1979 Reviewed In : 2018 |
|---|---|
| IS Title [Eng-Hn] : | Method of test for the usABility of resistors under pulse conditions |
| No of Revision : | 0 |
| No of Amendments : | 0 |
| Technical Department : | Electronics and Information Technology Department |
| Technical Committee : | LITD 5 ( Semiconductor And Other Electronic Components And Devices ) |
| Language : | English |
| Group : | Electronic and Telecom equipments, components and devices |
|---|---|
| Sub Group: | Electronic components and devices |
| Sub Sub Group : | Testing procedures for electromechanical components |
| Aspects: | Methods of tests |
| Certification: | Voluntary Certification |
| Ministry : | |
| Short Commom Man's Title: | Method of test for the usability of resistors under pulse conditions |
| Itchs: | N/A |
| Degree of Equivalence: | Modified/Technically Equivalent |
| Identical/Equivalent Standards: | IEC 60115-1 : 2008 |
| Organisation : |
| Indian Standards Refered In IS IS 9470 : 1979 : |
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| International Standards Refered In IS 9470 : 1979 | Standard contains no Cross Referenced International Standard. | ||||||||
| IS 9470 : 1979 is Refered in following Indian Standards : | Standard contains no Cross Referenced Indian Standard. | ||||||||