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BUREAU OF INDIAN STANDARDS
Programme of Work
LITD5 : Semiconductor And Other Electronic Components And Devices
- Scope : To prepare Indian standards relating to: a) Semiconductor devices & integrated circuits. b) Capacitors, resistrs, allied component c) Discrete semiconductor devices & micro-electromechanical systems d) Electronic assembly technologies and printed board assemblies. e) Capacitors resistors and inductors for use in electronics equipment.
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Liaison :IEC TC 40 - Capacitors and resistors for electronic equipment - Participating (P)
IEC TC 47 - Semiconductor devices - Observer (O)
TC 47/SC 47A - Integrated circuits - Observer (O)
IEC TC 91 - Electronics assembly technology - Participating (P)
IEC TC 47 / SC 47D - Semiconductor devices packaging - Observer (O)
IEC TC 47 / SC 47E - Discrete semiconductor devices - Observer (O)
TC 47/SC 47F - Micro electromechanical - Observer (O)
TC 47/SC 47D - Semiconductor devices packaging - Observer (O)
TC 47/SC 47E - Discrete semiconductor devices - Observer (O)
IS/QC 001001 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components (IECQ) - Basic rules (First Revision)
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March, 2024
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Identical under single numbering
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IS/QC 001002-1 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components (IECQ) - Rules of procedure: Part 1 administration (First Revision)
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March, 2024
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Identical under single numbering
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IS/QC 001002-2 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components (IECQ) - Rules of procedure: Part 2 Documentation (First Revision)
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March, 2024
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Identical under single numbering
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IS/QC 001002-3 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components (IECQ) - Rules of procedure: Part 3 approval procedures (First Revision)
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March, 2024
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Identical under single numbering
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IS/QC 001003 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components (IECQ) - Guidance documents
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March, 2024
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Identical under single numbering
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IS 10249 (Part 1) : 1982 Reviewed In : 2021 |
Specification for voltage dependent resistors (Varistors): Part 1 general requirements and methods of tests
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December, 2021
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Indigenous
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IS 11392 (Part 1/Sec 2) : 1988 Reviewed In : 2023 |
Dimensions of mounting accessories of pot cores for printed circuit board mountings: Part 1 for pot core of size 18 x 11 mm: Sec 2 type 2
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February, 2023
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Indigenous
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IS 11534 (Part 1) : 1985 Reviewed In : 2021 |
Specification for directly heated positive step - Function temperature coefficient thermistors: Part 1 general requirements and methods of tests
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December, 2021
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Modified/Technically Equivalent
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IS 12970 (Part 1) : 2010 Reviewed In : 2021 |
Semiconductor devices integrated circuits: Part 1 general
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December, 2021
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Identical under dual numbering
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IS 12970 (Part 2) : 2021 IEC 60748-2: 1997 Reviewed In : 2024 |
Semiconductor devices - Integrated circuits : Part 2 Digital integrated circuits essential ratings and characteristics Sec 1 General
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March, 2024
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Identical under dual numbering
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IS 12970 (Part 3) : 2021 IEC 60748-3: 1994 |
Semiconductor devices Integrated circuits Part 3 Analogue integrated circuits Superseding 1 IS 12970Part 5Sec 1:1991 2 IS 12970Part 5Sec 2:1992 3 IS 12970Part 5Sec 3:1992 4 IS 12970Part 5Sec 4:1992 5 IS 12970Part 5Sec 5:1993 6 IS 12970Part 5Sec
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Identical under dual numbering
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IS 13247 (Part 1) : 2021 IEC 60939-1: 2010 |
Passive filter units for electromagnetic interference suppression Part 1 Generic specification First Revision and Superseding 1 IS 3723Part 1:1978 2 IS 3723Part 2:1983 and 3 IS 3723Part 3:1983
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Identical under dual numbering
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IS 13247 (Part 2) : 2021 IEC 60939-2:2005 |
Passive filter units for electromagnetic interference suppression Part 2 Sectional specification Passive filter units for which safety tests are appropriate Test methods and general requirements First Revision of IS 13247 Part 2
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Identical under dual numbering
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IS 13554 : 2020 IEC 60294 : 2012 |
Measurement of the Dimensions of a Cylindrical Component with Axial Terminations ( First Revision )
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Identical under dual numbering
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IS 13562 : 1992 Reviewed In : 2021 |
Terminology related to microprocessors
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December, 2021
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Modified/Technically Equivalent
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IS 14901 (Part 1) : 2010 IEC 60747-1: 2006 Reviewed In : 2022 |
Semiconductor devices - Discrete devices and integrated circuits: Part 1 general (First Revision)
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February, 2022
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Identical under dual numbering
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IS 14901 (Part 2) : 2020 IEC 60747-2: 2016 |
Semiconductor Devices Part 2 Discrete Devices — Rectifier Diodes ( First Revision )
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Identical under dual numbering
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IS 14901 (Part 3) : 2016 IEC 60747-3 : 2013 Reviewed In : 2022 |
Semiconductor Devices Discrete Devices Part 3 Signal, Switching and Regulator Diodes
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August, 2022
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Identical under dual numbering
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IS 14901 (Part 5) : 2004 IEC 60747-5 Reviewed In : 2021 |
Semiconductor devices - Discrete devices and integrated circuits: Part 5 optoelectronic devices
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December, 2021
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2
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Identical under dual numbering
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IS 14901 (Part 7) : 2020 IEC 60747-7 : 2010 |
Semiconductor Devices — Discrete Devices Part 7 Bipolar Transistors ( First Revision )
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Identical under dual numbering
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IS 14901 (Part 8) : 2020 IEC 60747-8 : 2010 |
Semiconductor Devices — Discrete Devices Part 8 Field-Effect Transistors ( Second Revision )
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Identical under dual numbering
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IS 15866 (Part 1) : 2010 IEC 60938-1:2006 Reviewed In : 2021 |
Fixed inductors for electromagnetic interference suppression: Part 1 generic specification
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December, 2021
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Identical under dual numbering
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IS 1885 (Part 45) : 1977 Reviewed In : 2023 |
Electrotechnical vocabulary: Part 45 capacitors
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November, 2023
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Modified/Technically Equivalent
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IS/QC 300000 : 1988 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment generic specification
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March, 2021
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Identical under single numbering
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IS/QC 300100 : 1988 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment: Sectional specification: fixed polyethrsylene - Terephthalate film dielectric metal foil DC capacitor
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March, 2021
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Identical under single numbering
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IS/QC 300201 : 2000 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment: Part 15 blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode assessment level E
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March, 2021
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1
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Identical under single numbering
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IS/QC 300301 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification aluminium electrolytic capacitors with non - Solid electrolyte assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 300401 : 1988 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification fixed metallized polyethylene - Terephthalate film dielectric D C capacitors assessment level e
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March, 2021
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Identical under single numbering
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IS/QC 300600 : 1993 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment - Sectional specification for fixed capacitors of ceramic dielectric, class 1
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March, 2021
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Identical under single numbering
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IS/QC 300601 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment,blank detail specification for fixed capacitors of ceramic dielectric,class 1,assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 300700 : 1994 Reviewed In : 2018 |
Fixed capacitors for use in electronic equipment: Sectional specification for fixed capacitors of ceramic dielectric, class 2
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March, 2018
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Identical under single numbering
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IS/QC 300701 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed Capacitors for Use in Electronic Equipment Sectional Fixed Capacitors of Ceramic Dielectric, Class 2
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March, 2021
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Identical under single numbering
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IS/QC 300800 : 1994 Reviewed In : 2020 |
Fixed capacitors for use in electronic equipment: Sectional specification for fixed tantalum chip capacitors
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September, 2020
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Identical under single numbering
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IS/QC 300801 : 1993 Reviewed In : 2020 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification for fixed tantalum chip capacitors assessment level E
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September, 2020
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Identical under single numbering
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IS/QC 301200 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment Sectional specification for fixed metallized polypropylene film dielectric D.C. capacitors
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March, 2021
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Identical under single numbering
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IS/QC 301201 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment - Blank detail specification for fixed metallized polypropylene film dielectric D. C. capacitors - Assessment level e
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March, 2021
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Identical under single numbering
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IS/QC 301301 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment, blank detail specification for fixed metallized polypropylene film dielectric A.C. and pulse capacitors,assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 301800 : 2001 Reviewed In : 2020 |
Fixed capacitors for use in electronic equipment: Part 13 Secal specification fixed polypropylene film dielectric metal foil D.C. capacitors: Sec one - General
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September, 2020
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Identical under single numbering
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IS/QC 301801 : 2001 Reviewed In : 2020 |
Fixed capacitors for use in electronic equipment: Part 13 blank detail specification fixed polypropylene film dielectric metal foil D.C. capacitors assessment level E
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September, 2020
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Identical under single numbering
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IS/QC 302400 : 1994 Reviewed In : 2018 |
Fixed capacitors for use in electronic equipment: Sectional specification for fixed capacitors for electromagnetic interference suppression and connection to the supply mains
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March, 2018
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Identical under single numbering
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IS/QC 400100 : 1988 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment: Sectional specification fixed low - Power non - Wire wound resistors
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March, 2021
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Identical under single numbering
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IS/QC 400101 : 1988 Reviewed In : 2021 |
Fixed restors for use in electronic equipment blank detail specification fixed low - Power non - Wirewound resistors assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 400200 : 1992 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment: Sectional specification: fixed power resistors
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March, 2021
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Identical under single numbering
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IS/QC 400400 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Sectional specification for fixed resistor networks with individually measurable resistors
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March, 2021
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Identical under single numbering
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IS/QC 400401 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Blank detail specification - Fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 400500 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Sectional specification for fixed resistor networks in which not all resistors are individually measurable
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March, 2021
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Identical under single numbering
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IS/QC 400501 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Blank detail specification for fixed resistors networks in which not all resistors are individually measurable - Assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 400600 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment: Sectional specification for fixed chip resistors
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March, 2021
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Identical under single numbering
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IS/QC 400601 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment blank detail specification for fixed chip resistors assessment level E
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March, 2021
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Identical under single numbering
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IS/QC 410100 : 1992 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Potentiometers for use in electronic equipment Sectional specification lead - Screw actuated and rotary preset potentiometers
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March, 2021
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Identical under single numbering
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IS/QC 410101 : 1992 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Potentiometers for Use in Electronic Equipment Blank Detail Specification: Lead-Screw Actuated and Rotary Preset Potentiometers Assessment Level E
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March, 2021
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Identical under single numbering
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IS/QC 420000 : 1994 Reviewed In : 2023 |
Varistors for use in electronic equipment - Generic specification
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November, 2023
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-
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Identical under single numbering
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IS/QC 420100 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Varistors for use in electronic equipment. -Sectional specification for surge suppression varistors
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March, 2021
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Identical under single numbering
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IS/QC 420102 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Varistors for use in electronic equipment - Blank detail specification for zinc oxide surge suppression varistors - AsiEssment level E
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March, 2021
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Identical under single numbering
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IS/QC 440000 : 1994 Reviewed In : 2018 |
Directly heated positive step function temperature coefficient thermistors - Generic specification
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March, 2018
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Identical under single numbering
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IS/QC 440001 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Directly heated positive step function temperature coefficient thermistors - Blank detail specification - Assessment level E
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March, 2021
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Identical under single numbering
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IS 5001 : 2018 IEC 60191-1 : 2007 Reviewed In : 2021 |
Mechanical standardization of semiconductor devices - General rules for the preparation of outline drawings of discrete devices (First Revision)
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March, 2021
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Identical under dual numbering
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IS 5001 (Part 1) : 1969 Reviewed In : 2021 |
Guide for Preparation of Drawings of Semiconductor Devices
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March, 2021
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1
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Modified/Technically Equivalent
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IS/IEC 60068-2-20) : 2021 IEC 60068-2-20: 2021 |
Environmental testing Part 2 Tests Section 20 Tests Ta and Tb: Test methods for solderability and resistance to soldering heat of devices with leads
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Identical under single numbering
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IS/IEC 60068-2-58) : 2015 IEC 60068-2-58: 2015 |
Environmental testing Part 2 Tests Section 58 Test Td: Test methods for solderability resistance to dissolution of metallization and to soldering heat of surface mounting devicesSMD
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IS/IEC 60068-2-69) : 2017 IEC 60068-2-69 : 201 |
Environmental testing Part 2 Tests Section 69 Test TeTc: Solderability testing of electronic components and printed boards by the wetting balance force measurement method
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Identical under single numbering
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IS/IEC 60068-2-82) : 2019 IEC 60068-2-82: 2019 |
Environmental testing Part 2 Tests Section 82 Test Xw1: Whisker test methods for components and parts used in electronic assemblies
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IS/IEC 60068-2-83) : 2011 IEC 60068-2-83: 2011 |
Environmental testing Part 2 Tests Section 83 Test Tf: Solderability testing of electronic components for surface mounting devices SMD by the wetting balance method using solder paste
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Identical under single numbering
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IS/IEC 60115-1 : 2020 IEC 60115-1: 2020 |
Fixed resistors for use in electronic equipment Part 1 Generic specification
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Identical under single numbering
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IS/IEC 60194 : 2015 IEC 60194 : 2015 Reviewed In : 2021 |
Printed Board Design Manufacture and Assembly-Terms and Definitions
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March, 2021
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Identical under dual numbering
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IS/IEC 60195 : 2016 IEC 60195:2016 |
Method of measurement of current noise generated in fixed resistors Superseding IS 5027 : 1969
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Identical under single numbering
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IS/IEC 60384-4 : 2016 IEC 60384-4: 2016 |
Fixed capacitors for use in electronic equipment Part 4 Sectional specification Fixed aluminium electrolytic capacitors with solid MnO2 and non-solid electrolyte Superseding IS 4317: 1983 and ISQC 300300 : 1992
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Identical under single numbering
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IS/IEC 60384-15 : 2017 IEC 60384-15: 2017 |
Fixed capacitors for use in electronic equipment Part 15 Sectional specification: Fixed tantalum capacitors with non-solid or solid electrolyte
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Identical under single numbering
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IS/IEC 60384-141-1) : 2016 IEC 60384-14-1: 2016 |
Fixed capacitors for use in electronic equipment Part 14 Blank detail specification Fixed capacitors for electromagnetic interference suppression and connection to the supply mains Section 1 Assessment level DZ Superseding ISQC 302401 : 1994
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Identical under single numbering
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IS/IEC 60440 : 2012 IEC 60440 : 2012 |
Method of measurement of non-linearity in resistors
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Identical under single numbering
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IS/IEC 61189-1 : 2001 IEC 61189-1: 2001 |
Test methods for electrical materials interconnection structures and assemblies Part 1 General test methods and methodology
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Identical under single numbering
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IS/IEC 61189-2 : 2006 IEC 61189-2:2006 |
Test methods for electrical materials printed boards and other interconnection structures and assemblies Part 2:Test methods for materials for interconnection structures
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Identical under single numbering
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IS/IEC 61189-3 : 2007 IEC 61189-3: 2007 |
Test methods for electrical materials printed boards and other interconnection structures and assemblies Part 3 Test methods for interconnection structures printed boards
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Identical under single numbering
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IS/IEC 61189-5 : 2006 IEC 61189-5:2006 |
Test methods for electrical materials interconnection structures and assemblies Part 5 Test methods for printed board assemblies
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Identical under single numbering
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IS/IEC 62137-4 : 2014 62137-4: 2014 |
Electronics assembly technology Part 4 Endurance test methods for solder joint of area array type package surface mount devices
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Identical under single numbering
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IS/IEC 62326-1 : 2002 IEC 62326-1 : 2002 Reviewed In : 2024 |
Printed Boards Part 1 Generic specification
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March, 2024
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Identical under dual numbering
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IS/IEC 62326-20 : 2016 IEC 62326-20 : 2016 Reviewed In : 2024 |
Printed Boards Part 20 Printed Circuit Boards for High-Brightness LEDs
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March, 2024
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Identical under dual numbering
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IS/IEC 62421 : 2007 IEC 62421 : 2007 Reviewed In : 2024 |
Electronics Assembly Technology-Electronic Modules
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March, 2024
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Identical under dual numbering
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IS/IEC/TR 63091 : 2017 IEC TR 63091: 2017 |
Study for the derating curve of surface mount fixed resistors Derating curves based on terminal part temperature
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Identical under single numbering
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IS 7305 : 2018 IEC 60384-1 : 2016 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment - Generic specification (Second Revision)
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March, 2021
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Identical under dual numbering
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IS/QC 760000 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Generic specification for film integrated circuits and hybrid film integrated circuits
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March, 2021
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Identical under single numbering
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IS/QC 760100 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure
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March, 2021
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Identical under single numbering
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IS/QC 760101 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure
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March, 2021
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Identical under single numbering
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IS/QC 760200 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - SectlOnal specification for film integrated circuits and hybrid film integrated circuits on the basis of the capablity approval procedures
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March, 2021
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Identical under single numbering
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IS/QC 760201 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
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March, 2021
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Identical under single numbering
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IS/QC 790130 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for HCMOS digital integrated circuits (Series 54/74 HC, 54/74 HCT, 54/74 HCU)
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March, 2021
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Identical under single numbering
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IS/QC 790131 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for complementary MOS digital integrated circuits (Series 4000 Band 4000 Ub)
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March, 2021
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Identical under single numbering
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IS/QC 790132 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (Excluding Uncommitted Logic Arrays)
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March, 2021
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Identical under single numbering
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IS/QC 790202 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Analogue integrated circuits blank detail specification for monolithic integrated operational amplifiers
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March, 2021
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Identical under single numbering
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IS 8186 : 2020 IEC 60062 : 2016 |
Marking Codes for Resistors and Capacitors ( First Revision )
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Identical under dual numbering
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IS 824 : 2021 IEC 60063: 2015 |
Preferred number series for Resistors and Capacitors
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Identical under dual numbering
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IS 8872 (Part 1) : 2018 IEC 60393-1 : 2008 Reviewed In : 2021 |
Potentiometers for use in electronic equipment: Part 1 generic specification (First Revision)
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November, 2021
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-
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Identical under dual numbering
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IS 9000 (Part 19/Sec 15) : 1986 Reviewed In : 2022 |
Basic environmental testing procedures for electronic and electrical items: Part 19 test u: robustness of terminations and integral mounting devices (First Revision)
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October, 2022
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-
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Indigenous
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IS 9256 (Part 1) : 2019 IEC 60384-2 : 2011 Reviewed In : 2022 |
Fixed capacitors for use in electronic equipment: Part 1 Sectional specification - Fixed metallized polyethylene terephthalate film dielectric d.c. capacitors (First Revision)
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May, 2022
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-
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Identical under dual numbering
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IS 9638 (Part 1) : 1980 Reviewed In : 2021 |
Specification for fixed polyester film dielectric capacitors for direct current: Part 1 general requirements and methods of tests
|
December, 2021
|
-
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Indigenous
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No Records Found |
No Records Found |
LITD 5 (23273) |
Semiconductor Devices Discrete Devices Part 7 Bipolar Transistors First Revision Amendment - 1 |
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LITD 5 (25416) |
Varistors for use in Electronic Equipment Part 1 Generic Specification |
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LITD 5 (25417) |
Fixed Capacitors for use in Electronic Equipment Part 11 Sectional Specification Fixed Polyethylene-Terephthalate Film Dielectric Metal Foil DC Capacitors |
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LITD 5 (25418) |
Fixed Capacitors for use in Electronic Equipment Part 8 Sectional Specification Fixed Capacitors of Ceramic Dielectric Class 1 |
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LITD 5 (25420) |
Fixed Capacitors for use in Electronic Equipment Part 3 Sectional Specification Surface Mount Fixed Tantalum Electrolytic Capacitors with Solid MnO2 Electrolyte |
LITD 5 (16612)
|
Printed Circuit Board Assembly Part 1 Safety Requirements |
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LITD 5 (23274)
|
Semiconductor Devices Discrete Devices Part 8 Field-Effect Transistors Second Revision Amendment - 1 |
LITD 5 (16543)
|
Printed Circuit Boards Part 1 Safety Requirements |
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LITD 5 (23249)
|
Environmental Testing Part 2 Tests Section 21 Test U Robustness of Terminations and Integral Mounting Devices Superseding IS 9000 Part 19Section 1 to 5 1986 |
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LITD 5 (23250)
|
Fixed resistors for use in electronic equipment Part 2 Sectional specification Low-power film resistors with leads for through-hole assembly on circuit boards THT |
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LITD 5 (23252)
|
Fixed resistors for use in electronic equipment Part 2 Blank detail specification Section 10 Low-power film resistors with leads for through-hole assembly on circuit boards THT for general electronic equipment classification level G |
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LITD 5 (23253)
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Fixed resistors for use in electronic equipment Part 4 Sectional specification Power resistors for through hole assembly on circuit boards THT or for assembly on chassis Superseding ISQC 400200 1992 |
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LITD 5 (23254)
|
Fixed Capacitors for use in Electronic Equipment Part 1 Generic Specification |
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LITD 5 (23255)
|
Fixed Capacitors for use in Electronic Equipment Part 1 Generic Specification Section 1 Blank Detail Specification |
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LITD 5 (23256)
|
Fixed Capacitors for use in Electronic Equipment Part 2 Sectional Specification - Fixed Metallized Polyethylene Terephthalate Film Dielectric DC Capacitors |
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LITD 5 (23257)
|
Fixed Capacitors for use in Electronic Equipment Part 14 Sectional Specification - Fixed Capacitors for Electromagnetic Interference Suppression and Connection to the Supply Mains Superseding ISQC 302400 1994 |
|
LITD 5 (23258)
|
Thermistors Directly heated positive temperature coefficient Part 1 Generic specification |
LITD 5 (18473)
|
Fixed capacitors for use in electronic equipment Part 9 Sectional specification Fixed capacitors of ceramic dielectric Class 2 Superseding IS 2786 Part 1 1978 and ISQC 300700 1994 |
|
IS 10249 (Part 2/Sec 1) : 1983 Reviewed In : 2021 |
Specification for voltage dependent resistors Varistors Part 2 low voltage Sec 1 type VDF 1 |
|
IS 10249 (Part 2/Sec 2) : 1983 Reviewed In : 2021 |
Specification - for voltage dependent resistors Varistors Part 2 low voltage Sec 2 type VDS 1 |
|
IS 1031 : 1967 |
Methods of measurements on loudspeakers and loudspeaker systems |
|
IS 1032 : 1957 |
General requirements end tests for pressure unit operated horn loudspeaker systems |
|
IS 10320 : 1982 IEC 60701 Reviewed In : 2008 |
General requirements and tests for axial lead cores made of magnetic oxides or iron powder |
|
IS 1033 : 1957 |
General requirement and tests for direct radiator moving coil loudspeaker |
|
IS 1034 : 1957 |
Loudspeakers systems for community radio receivers |
|
IS 10424 : 1982 Reviewed In : 2020 |
Guide for design and use of printed boards |
|
IS 10477 : 1982 Reviewed In : 2023 |
Environmental testing procedures for microcircuits |
|
IS 10825 (Part 1) : 1975 Reviewed In : 2021 |
Specification for ceramic dielectric capacitors type 1 Part 1 general requirements and methods of tests |
|
IS 10825 (Part 2) : 1984 Reviewed In : 2021 |
Specification for ceramic dielectric capacitors type 1 Part 2 type FCCT - 1 |
|
IS 10825 (Part 3) : 1984 Reviewed In : 2021 |
Specification for ceramic capacitors type 1 Part 3 FCCT 2 |
|
IS 10991 (Part 1) : 1984 Reviewed In : 2021 |
Specification for fixed metallized polypropylene film dielectric capacitors Part 1 general requirements and methods of tests |
|
IS 11214 : 1984 Reviewed In : 2020 |
Guide for repair of printed wiring boards and assemblies |
|
IS 11392 (Part 1/Sec 1) : 1985 Reviewed In : 2023 |
Dimensions of mounting accessories of pot cores for printed circuit board mountings Part 1 - For pot cores of size 18 x 11 Mm Sec 1 type 1 |
|
IS 11515 (Part 1) : 1985 Reviewed In : 2018 |
Specification for fixed metallized polycarbonate film dielectric capacitors Part 1 general requirements and methods of tests |
|
IS 11515 (Part 2) : 1986 Reviewed In : 2018 |
Specification for fixed metallised polycarbonate film dielectric capacitors Part 2 type FCCM 1 |
|
IS 11515 (Part 3) : 1986 Reviewed In : 2018 |
Specification for fixed metallised polycarbonate film dielectric capacitors Part 3 type FCCM 2 |
|
IS 12032 (Part 5) : 1993 IEC 617-5: 1983 Reviewed In : 2018 |
Graphical symbols for diagrams in the field of electrotechnology Part 5 semiconductors and electron tubes |
|
IS 12032 (Part 12) : 1994 IEC 617-12: 1983 Reviewed In : 2018 |
Graphical symbols for diagrams in the field of electrotechnology Part 12 binary logic elements |
|
IS 12032 (Part 13) : 1992 IEC 617-13: 1978 Reviewed In : 2018 |
Graphical symbols for diagrams in the field of electrotechnology Part 13 analogue elements |
|
IS 12071 : 1987 Reviewed In : 2017 |
Guide for assembly of printed boards |
|
IS 12284 : 1988 Reviewed In : 2020 |
Specification for prepreg for ruse in multilayer printed boards |
|
IS 12641 : 2004 IEC 60749: 2002 Reviewed In : 2018 |
Semiconductor devices - Mechanical and climatic test methods First Revision |
|
IS 12970 (Part 2/Sec 2) : 1992 Reviewed In : 2018 |
Semiconductor devicesintegrated circuits Part 2 digital integrated circuits - Essential ratings and characteristics Sec 2 integrated circuit memories |
|
IS 12970 (Part 2/Sec 3) : 1993 Reviewed In : 2018 |
Semiconductordevices - Integrated circuits Part 2 digital integrated circuits - Essential rating and characteristics Sec 3 integrated circuit microprocessors |
|
IS 12970 (Part 3/Sec 1) : 1992 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 3 digital integrated circuits - Measuring methods Sec 1 general |
|
IS 12970 (Part 3/Sec 2) : 1992 Reviewed In : 2018 |
Semkonductor devices integrated circuits Part 3 digital integrated circuits - Measuring methods Sec 2 static characteristics |
|
IS 12970 (Part 3/Sec 3) : 1993 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 3 digital integrated circuits - Measuring methods Sec 3 dynamic measurements |
|
IS 12970 (Part 5/Sec 2) : 1992 Reviewed In : 2018 |
Semiconductor devices integrated circuits Part 5 analogue integrated circuits - Essential ratings and characteristics Sec 2 operational amplifiers |
|
IS 12970 (Part 5/Sec 3) : 1992 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 5 analogue integrated circuits - Essential ratings and characteristics Sec 3 audio amplifiers video amplifiers and multichannel amplifiers for telecommunications |
|
IS 12970 (Part 5/Sec 4) : 1992 Reviewed In : 2018 |
Semiconductor devices - 1ntegrate d circuits Part 5 analogue integrated circuits - essential ratings and characteristics Sec 4 R F and I F amplifiers |
|
IS 12970 (Part 5/Sec 5) : 1993 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 5 analogue integrated circuits - Essential ratings and characteristics Sec 5 voltage and current regulators |
|
IS 12970 (Part 5/Sec 6) : 1993 Reviewed In : 2018 |
Semiconductordevices - Integrated circuits Part 5 analogue lNtegrated circuits - Essential ratings and characteristics Sec 6 analogue signal switching circuits |
|
IS 12970 (Part 6/Sec 1) : 1992 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 6 analogue integrated circuits measuring methods Sec 1 general |
|
IS 12970 (Part 6/Sec 2) : 1992 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 6 analogue integrated circuits measuring methods Sec 2 linear amplifiers |
|
IS 12970 (Part 6/Sec 3) : 1992 Reviewed In : 2018 |
SemicOnductor devices integrated circuits Part 6 analogue integrated circuits measuring methods Sec 3 voltage regulators |
|
IS 12970 (Part 6/Sec 4) : 1992 Reviewed In : 2018 |
Semiconductor devices - Integrated circuits Part 6 analogue integrated circuits - Measuring methods Sec 4 analogue signal switching circuits |
|
IS 1301 : 1958 |
Code of safety requirements for electronic mains-operated audio amplifiers incorporated in IS 616 |
|
IS 1302 : 1958 |
Methods of measurements on audio amplifiers incorporated in IS 9302 Part 2 |
|
IS 13342 : 2001 ISO 1185 Reviewed In : 2008 |
Magnetic Oxide Cores ETD - Cores Intended for use in Power Supply Applications - Dimensions |
|
IS 13504 : 1992 Reviewed In : 2020 |
Method of measurement of non - Linearity in resistors |
|
IS 13669 : 1993 IEC 249-3-3 Reviewed In : 2008 |
Permanent polymer coating materials solder-resist for use in the manufacture of printed circuits |
|
IS 1490 : 1959 |
Recommendations for minimum performance requirements of mains-operated public address amplifiers incorporated in IS 10426 |
|
IS 14901 (Part 4) : 2016 IEC 60747-4 |
Semiconductor Devices Discrete Devices Part 4 Microwave Diodes and Transistors |
|
IS 14901 (Part 5/Sec 1) : 2010 IEC 60747-5: 2002 Reviewed In : 2014 |
Semiconductor Devices - Discrete Devices and Integrated Circuits Part 5 Optoelectronic Devices Secton 1 General |
|
IS 14924 : 2001 IEC 758 Reviewed In : 2008 |
Synthetic Quartz Crystal s and Guide to the Use |
|
IS 15212 : 2002 IEC/PAS 62212 Reviewed In : 2008 |
Specification and Characterization Methods for Nonwoven E Glass Mat |
|
IS 15213 : 2002 IEC/PAS 62213 Reviewed In : 2008 |
Specification and Characterization Methods for Nonwoven Para-Aramid Reinforcement |
|
IS 15214 : 2002 IEC/PAS 62119 Reviewed In : 2008 |
Generic Requirements for Implementation of Product Manufacturing Description Data and Transfer Methodology |
|
IS 15215 : 2002 IEC/PAS 62123 Reviewed In : 2008 |
Performance Guide Manual for Single- and Double-Sided Flexible Printed Wiring Boards |
|
IS 15252 : 2002 IEC/PAS 62214 Reviewed In : 2008 |
Generic Performance Printed Boards |
|
IS 15479 : 2004 IEC/PAS 62293 Reviewed In : 2019 |
Qualification and performance specification for high density interconnect HDI layers or boards |
|
IS 1819 : 1961 |
Recommendations for general requirements of public address amplifiers |
|
IS 1885 (Part 6) : 1978 Reviewed In : 2014 |
Electrotechnical vocabulary Part 6 printed circuits First Revision |
|
IS 1885 (Part 7) : 2001 Reviewed In : 2017 |
Electrotechnical vocabulary Part 7 semiconductor devices and integrated circuits Second Revision |
|
IS 1885 (Part 46) : 1977 Reviewed In : 2023 |
Electrotechnical vocabulary Part 46 resistors |
|
IS 2001 : 1968 Reviewed In : 2018 |
Specification for fixed silvered mica capacitors First Revision |
|
IS 2032 (Part 8) : 1965 Reviewed In : 2023 |
Graphical symbols used in electrotechnology Part 8 semiconductor devices |
|
IS 2032 (Part 17) : 1975 Reviewed In : 2011 |
Graphical symbols used in electrotechnology Part 17 Ferrite cores and magnetic storage matrices |
|
IS 2032 (Part 24) : 1980 IEC 117-13 Reviewed In : 2011 |
Graphical symbols used in electrotechnology Part 24 Binary logic elements |
|
IS 2748 : 1964 |
Methods of measurements on microphones |
|
IS 2786 (Part 1) : 1978 Reviewed In : 2021 |
Specification for ceramic dielectric capacitors type 2 Part 1 general requirements and methods of test First Revision |
|
IS 2786 (Part 2) : 1984 Reviewed In : 2023 |
Specification for ceramic dielectric capacitors type 2 Part 2 FCCG 01 and FCCG 02 capacitors |
|
IS/QC 300200 : 2000 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment Part 15 sectional specification fixedtantalum capacitors with non - Solid or solid electrolyte |
|
IS/QC 300300 : 1992 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment Sectional specification aluminium electrolytic capacitors with solid and non - Solid elecrolyte |
|
IS/QC 300400 : 1988 Reviewed In : 2018 |
Fixed capacitors for use in electronic equipment Sectional specification fixed metallized polyethylene Terephthalate film dielectric DC capacitors |
|
IS/QC 302401 : 1994 Reviewed In : 2018 |
Fixed capacitors for use in electronic equipment blank detail specification for fixed capacitors for electromagnetic interference suppression and connection to the supply mains assessment level D |
|
IS 3641 : 1976 |
Methods of measurements on hearing aids |
|
IS 3671 (Part 1) : 1980 Reviewed In : 2018 |
Specification for air dielectric variable tuning capacitors Part 1 tests and general requirements First Revision |
|
IS 3700 (Part 7) : 1970 Reviewed In : 2023 |
Essential ratings and characteristics of semiconductor devices Part 7 reverse blocking triode thyristors |
|
IS 3715 (Part 4) : 1971 Reviewed In : 2018 |
Letter symbols for semiconductor devices Part 4 thyristors First Revision |
|
IS 3723 (Part 1) : 1978 Reviewed In : 2021 |
Specification for capacitors for radio interference suppression Part 1 general requirements and methods of tests First Revision |
|
IS 3723 (Part 2) : 1983 Reviewed In : 2021 |
Specification for capacitors for radio interference suppression Part 2 type Fcrs 1 |
|
IS 3723 (Part 3) : 1983 Reviewed In : 2021 |
Specification for capacitors for radio interference suppression Part 3 type Fcrs 2 |
|
IS/QC 390000 : 1994 Reviewed In : 2018 |
Fixed film resistor networks for use in electronic equipment - Generic specification |
|
IS/QC 390100 : 1993 Reviewed In : 2018 |
Fixed film resistor networks for use in electronic equipment Secal specification for film resistornetworksofassessedquality on the basis of the capability approval procedure |
|
IS/QC 390101 : 1993 Reviewed In : 2018 |
Fixed film resistor networks for use in electronic equipment blank detail specification for film resistor networks of assessed quality on the basis of the capABility approval procedure - Assessment level e |
|
IS 3931 : 1966 |
Sound level meters for the measurement of noise emitted by motor vehicles incorporated in IS 9779 |
|
IS 3932 : 1966 |
Sound level meters for general purpose use incorporated in IS 9779 |
|
IS/QC 400000 : 1988 Reviewed In : 2018 |
Fixed resistors for use in electronic equipment generic specification |
|
IS/QC 400300 : 1992 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment Sectional specification fixed precision resistors |
|
IS/QC 400301 : 1992 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment blank detail specification fixed precision resistors assessment level E |
|
IS/QC 400402 : 1993 Reviewed In : 2018 |
Fixed resistors for use inelectronic equipment - Blank detail specification - Fixed resistor networks with individually measurable resistors of either different resistance valuesor different rated dissipations assessment level E |
|
IS/QC 410000 : 2000 Reviewed In : 2018 |
Potentiometers for use in electronic equipment Part 1 generic specification Sec 1 Scope |
|
IS/QC 420101 : 1994 Reviewed In : 2018 |
Varistors for use in electronic equipment - Blank detail specification for silicon carbide surge suppression varistors assessment level E |
|
IS 4317 : 1983 Reviewed In : 2021 |
Specification for aluminium electrolytic capacitors with non - Solid electrolyte Second Revision |
|
IS 4400 (Part 7) : 1971 Reviewed In : 2018 |
Methods of measurements on semiconductor devices Part 7 reverse blocking triode thyristors |
|
IS 4406 : 1967 |
General Requirements For Hearing Aids |
|
IS 4411 : 1967 Reviewed In : 2021 |
Code for designation of semiconductor devices |
|
IS 4482 : 1967 |
Hearing Aids |
|
IS 4633 : 1968 Reviewed In : 2015 |
Fixed Metallized-paper Dielectric Capacitor for Direct Current |
|
IS 5000 (Part 1) : 1969 Reviewed In : 2008 |
Dimensions of semiconductor devices Devices outline OD 1 |
|
IS 5000 (Part 4) : 1969 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 4 |
|
IS 5000 (Part 5) : 1969 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 5 |
|
IS 5000 (Part 6) : 1969 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD6 |
|
IS 5000 (Part 7) : 1969 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD7 |
|
IS 5000 (Part 8) : 1969 Reviewed In : 2008 |
Dimensions of Semiconductor Devices - Device Outline OD8 |
|
IS 5000 (Part 9) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 9 |
|
IS 5000 (Part 10) : 1971 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD10 |
|
IS 5000 (Part 11) : 1971 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD11 |
|
IS 5000 (Part 12) : 1971 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 12 |
|
IS 5000 (Part 13) : 1971 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 13 |
|
IS 5000 (Part 14) : 1971 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD14 |
|
IS 5000 (Part 15) : 1973 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 15 |
|
IS 5000 (Part 16) : 1973 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD16 |
|
IS 5000 (Part 17) : 1974 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 17 |
|
IS 5000 (Part 18) : 1974 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD18 |
|
IS 5000 (Part 19) : 1974 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD19 |
|
IS 5000 (Part 20) : 1978 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD 20 |
|
IS 5000 (Part 21) : 1979 Reviewed In : 2008 |
Dimensions of Semiconductor Device Outline OD 21 |
|
IS 5000 (Part 23) : 1978 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 23 |
|
IS 5000 (Part 25) : 1978 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 25 |
|
IS 5000 (Part 26) : 1978 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 26 |
|
IS 5000 (Part 27) : 1978 Reviewed In : 2008 |
Dimensions of Semiconductor Device Outline OD 27 |
|
IS 5000 (Part 28) : 1978 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD 28 |
|
IS 5000 (Part 29) : 1979 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 29 |
|
IS 5000 (Part 31) : 1981 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD31 |
|
IS 5000 (Part 32) : 1981 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 32 |
|
IS 5000 (Part 33) : 1981 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 33 |
|
IS 5000 (Part 34) : 1981 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD34 |
|
IS 5000 (Part 35) : 1981 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 35 |
|
IS 5000 (Part 36) : 1981 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 36 |
|
IS 5000 (Part 37) : 1982 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 37 |
|
IS 5000 (Part 38) : 1984 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD38 |
|
IS 5000 (Part 39) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 39 |
|
IS 5000 (Part 40) : 1986 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD 40 |
|
IS 5000 (Part 41) : 1986 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD 41 |
|
IS 5000 (Part 42) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 42 |
|
IS 5000 (Part 43) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 43 |
|
IS 5000 (Part 44) : 1986 Reviewed In : 2008 |
Dimensions of Semiconductor Devices Device Outline OD44 |
|
IS 5000 (Part 45) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 45 |
|
IS 5000 (Part 46) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 46 |
|
IS 5000 (Part 47) : 1986 Reviewed In : 2008 |
Dimensions of semiconductor devices Device outline OD 47 |
|
IS 5001 (Part 2) : 1973 Reviewed In : 2015 |
Guide for preparation of drawings of semiconductor devices and integrated circuits Part 2 Integrated circuits |
|
IS 5027 : 1969 Reviewed In : 2021 |
Method of measurement of current noise generated in fixed resistors |
|
IS 5469 (Part 1) : 1969 Reviewed In : 2020 |
Code of practice for the use of semiconductor junction devices Part 1 applicable to all devices |
|
IS 5469 (Part 2) : 1973 Reviewed In : 2021 |
Code of practice for the use of semiconductor junction devices Part 2 diodes |
|
IS 5469 (Part 3) : 1973 Reviewed In : 2021 |
Code of practice for the use of semiconductor junction devices Part 3 thyristors |
|
IS 5475 (Part 1) : 1978 Reviewed In : 2015 |
Polystyrene Film Dielectric Capacitors - Part I General Requirements and Methods of Tests |
|
IS 5475 (Part 2) : 1979 Reviewed In : 2023 |
Specification for polystyrene film dielectric capacitors Part 2 type FCPS 1 |
|
IS 5475 (Part 4) : 1985 Reviewed In : 2023 |
Specification for fixed polystyrene film dielectric capacitors Part 4 type FCPS - 3 |
|
IS 5786 (Part 1) : 2018 IEC 60115-1 : 2008 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment Part 1 generic specification Second Revision |
|
IS 5786 (Part 3) : 1982 Reviewed In : 2018 |
Specification for fixed resistors general purpose low power Part 3 resistors type FRLP 2 First Revision |
|
IS 5786 (Part 4) : 1982 Reviewed In : 2018 |
Specification for fixed resistors general purpose low power Part 4 resistors type FRLP 3 First Revision |
|
IS 5786 (Part 5) : 1982 Reviewed In : 2018 |
Specification for fixed resistors general purpose low power Part 5 resistors type FRLP 4 First Revision |
|
IS 5786 (Part 6) : 1982 Reviewed In : 2018 |
Specification for fixed resistors general purposes low power Part 4 resistors type FRLP 5 First Revision |
|
IS 5786 (Part 7) : 1982 Reviewed In : 2023 |
Specification for fixed resistors general purpose low power Part 7 resistor type frlp 6 First Revision |
|
IS 5786 (Part 10) : 1982 Reviewed In : 2018 |
Specification for fixed resistors general purpose low power Part 10 resistors type FRLP 9 First - Revision |
|
IS 5786 (Part 12) : 1982 Reviewed In : 2018 |
Specification for fiexd resistors general purpose low power Part x11 resistors type FRLP 11 |
|
IS 590 : 1964 Reviewed In : 2021 |
Specification for fixed paper dielectric capacitors for dc Revised |
|
IS 5921 (Part 1) : 1993 IEC 249-1 Reviewed In : 2008 |
Metal-clad base materials for printed circuits for use in electronic and telecommunication equipment Part 1 General requirements and test |
|
IS 5921 (Part 2) : 1973 IEC 249-2 Reviewed In : 2008 |
Metal-Clad Base Material for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 2 Paper Phenolic Copper-Clad Laminated Sheet-PF-CP-CU Economic Grade |
|
IS 5921 (Part 3) : 1978 IEC 249-2 Reviewed In : 2008 |
Metal-Clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 3 Phenolic Cellulose Paper Copper-Clad Laminated Sheet PF-CP-Cu High Electric Grade |
|
IS 5921 (Part 4) : 1987 IEC 249-2 Reviewed In : 2008 |
Metal-clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 4 Phenolic Cellulose Paper Copper Clad Laminated Sheet of Defined Flammability |
|
IS 5921 (Part 5) : 1987 IEC 249-2 Reviewed In : 2008 |
Metal Clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 5 Epoxide Cellulose Paper Copper Clad Laminated Sheet of Defined Flammability vertical burning test |
|
IS 5921 (Part 6) : 1987 IEC 249-2 Reviewed In : 2008 |
Metal Clad Base Materials for Use in Electronic and Telecommunication Equipment - Part 6 Epoxide Woven Glass Fabric Copper Clad Laminated Sheet General Purpose Grade |
|
IS 5921 (Part 7) : 1987 IEC 249-2 Reviewed In : 2008 |
Metal Clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 7 Epoxide Woven Glass Fabric Copper-Clad Laminated Sheet of Defined Flammability |
|
IS 5921 (Part 8) : 1988 IEC 249-2 Reviewed In : 2008 |
Metal-clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 8 Flexible Copper-clad Polyster PETP Film |
|
IS 5921 (Part 9) : 1988 IEC 249-2 Reviewed In : 2008 |
Metal-Clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 9 Epoxide Cellulose Paper Core Epoxide Glass Cloth Surfaces Copper-Clad Laminated Sheet of Defined Flammability |
|
IS 5921 (Part 10) : 1988 IEC 249-2 Reviewed In : 2008 |
Metal clad base materials for printed circuits for use in electronic and telecommunication equipment Part 10 Epoxide non-woven glass reinforced woven copper-clad laminated sheet of defined flammability VBT |
|
IS 5921 (Part 11) : 1988 IEC 249-2 Reviewed In : 2008 |
Metal clad base materials for printed circuits for use in electronic and telecommunication equipment Part 11 Thin epoxide woven glass fabric copper clad laminated sheet general purpose grade for use in the fabrication of multilay |
|
IS 5921 (Part 12) : 1988 IEC 249-2 Reviewed In : 2008 |
Specification forMetal-Clad Base Materials for Printed Circuits for Use in Electronic and Telecommunication Equipment - Part 12 Thin Epoxide Woven Glass Fabric Copper-Clad Laminated Sheet of Defined Flammability for Use in Fabrication of Multilayer |
|
IS 6098 : 1971 |
Methods of measurement of airborne noise emitted by rotating electrical machinery |
|
IS 6553 : 1971 Reviewed In : 2015 |
Environmental requirements for semiconductor devices and integrated circuits |
|
IS/QC 720100-12 : 2001 Reviewed In : 2020 |
Semiconductor devices Part 12 Secal specification for optoelectronic devices |
|
IS 7405 (Part 1) : 1994 IEC 326-2 Reviewed In : 2008 |
printed wiring boards Part 1 General requirements and methods of test |
|
IS 7405 (Part 2) : 1984 IEC 326-4 Reviewed In : 2008 |
printed wiring boards Part 2 Single and double sided printed boards with plain holes |
|
IS 7412 : 1974 Reviewed In : 2015 |
Life testing of semiconductor devices |
|
IS 7440 (Part 2) : 1974 Reviewed In : 2015 |
Essential ratings and characteristics of analogue integrated circuits Part 2 Telecommunication amplifiers audio video and multichannel |
|
IS 7440 (Part 3/Sec 1) : 1976 Reviewed In : 2015 |
Essential ratings and characteristics of analogue integrated circuits Part 3 Operational amplifier Sec 1 Having two input and one output |
|
IS 7440 (Part 3/Sec 2) : 1977 Reviewed In : 2015 |
Essential ratings and characteristics of analogue integrated circuits Part 3 Operational amplifier Sec 2 Having two input and two outputs |
|
IS/QC 750102 : 1989 Reviewed In : 2017 |
Semiconductor devices - Discrete devices - Bipolar transistors blank detail specification for ambient - Rated bipolar transistors for low and high - Frequency amplification |
|
IS/QC 750104 : 1993 Reviewed In : 2018 |
Semiconductor devices - Discrete devices - Bipolar transistors - Blank detail specification for bipolar transistors for switching applications |
|
IS/QC 750105 : 1994 Reviewed In : 2018 |
Semiconductor devices - Discrete devices - Signal Including Switching and regulator diodes - Blank detail specification for voltage - Regulator diodes and voltage - Reference diodes excluding temperature - Compensated precision reference diodes |
|
IS/QC 750107 : 1994 Reviewed In : 2018 |
Semiconductor devices - Discrete device - Bipolar transistors - Blank detail specification for case - Rated bipolar transistors for high - Frequency amplification |
|
IS/QC 750108 : 1992 Reviewed In : 2018 |
Semiconductor devices - Discrete devices rectifier diodes blank detail specification for rectifier diodes Including Avalanche Recti6er Diodes ambient and case - Rated up to 100 a |
|
IS/QC 750111 : 1994 Reviewed In : 2018 |
Semiconductor devices - Discrete devices Part 6 thyristors Sec 2 blank detail specification for bidirectional triode thyristors Triacs ambient or case - Rated up to 100 a |
|
IS 7741 (Part 1) : 1975 IEC 268-5 |
Loudspeakers Part 1 - General requirements and tests |
|
IS 7741 (Part 4) : 1977 Reviewed In : 1993 |
loudspeakers Part 4 Loudspeakers for community radio receivers |
|
IS 7748 (Part 1) : 1975 Reviewed In : 2018 |
Specification for variable capacitors Part 1 tests and general requirements |
|
IS 8083 : 1976 Reviewed In : 2015 |
Dimensions of ceramic dielectric capacitors of the plate type |
|
IS 8238 : 1976 Reviewed In : 2015 |
Guide for use of variable capacitors in electronic equipment |
|
IS 8426 : 2001 IEC 60556 Reviewed In : 2008 |
Measuring Methods for Properties of Gyromagnetic Materials Intended for Application at Microwave Frequencies |
|
IS 8507 (Part 1) : 1977 Reviewed In : 2021 |
Specification for fixed tantalum capacitors with solid electrolyte Part 1 general requirements and methods of tests |
|
IS 8507 (Part 2/Sec 1) : 1981 Reviewed In : 2023 |
Specification for fixed insulated hermetically sealed tantalum capacitors with solid electrolyte Part 2 type FCST 1 Sec 1 polar |
|
IS 8507 (Part 2/Sec 2) : 1982 Reviewed In : 2023 |
Specification for fixed insulated hermetically sealed tantalum capacitors with solid electrolyte Part 2 type FCST 1 Sec 2 non - Polar |
|
IS 8507 (Part 3/Sec 1) : 1981 Reviewed In : 2023 |
Specification for fixed insulated hermetically sealed tantalum capacitors with solid electrolyte Part 3 type fcst 2 Sec 1 polar |
|
IS 8507 (Part 3/Sec 2) : 1982 Reviewed In : 2023 |
Specification for fixed insulated hermetically sealed tantalum capacitors with sealed electrolyte Part 3 type fcst 2 Sec 2 non - Polar |
|
IS 8507 (Part 4/Sec 1) : 1983 Reviewed In : 2023 |
Specification for fixed insulated hermetically sealed tantalum capacitors with solid electrolyte Part 4 type FCST 3 Sec 1 polar |
|
IS 8872 (Part 2/Sec 1) : 1979 Reviewed In : 2018 |
Specification for variable resistors Part 2 general purpose Sec 1 type vrgic |
|
IS 8872 (Part 2/Sec 2) : 1979 Reviewed In : 2018 |
Specification for variable resistors Part 2 general purpose Sec 2 type VRG 2C |
|
IS 8872 (Part 2/Sec 3) : 1979 Reviewed In : 2018 |
Specification for variable resistors Part 2 general purpose Sec 3 type VRG3C |
|
IS 8872 (Part 2/Sec 4) : 1979 Reviewed In : 2018 |
Specification for variable resistors Part 2 general purpose Sec 4 type vrg4p |
|
IS 8872 (Part 2/Sec 5) : 1980 Reviewed In : 2018 |
Specification for variable resistors Part 2 general purpose Sec 5 type VRG 5C |
|
IS 8872 (Part 2/Sec 6) : 1980 Reviewed In : 2018 |
Specification for variable resistors Part 2 general purpose Sec 6 type VRG 6C |
|
IS 8872 (Part 3/Sec 1) : 1979 Reviewed In : 2018 |
Specification for variable resistors Part 3 precision Sec 1 type VRP 1P |
|
IS 8872 (Part 3/Sec 2) : 1979 Reviewed In : 2018 |
Specification for variable resistors Part 3 precision Sec 2 type VRP 1P |
|
IS 8872 (Part 4/Sec 1) : 1980 Reviewed In : 2021 |
Specification for variable resistors Part 4 preset Sec 1 type VRT 1 |
|
IS 8872 (Part 4/Sec 2) : 1983 Reviewed In : 2018 |
Specification for variable resistors Part 4 presents Sec 2 type VRT 2P |
|
IS 8872 (Part 4/Sec 3) : 1982 Reviewed In : 2018 |
Specification for variable resistors Part 4 presets Sec 3 type VRT 3 |
|
IS 8872 (Part 4/Sec 4) : 1984 Reviewed In : 2018 |
Specification for variable resistors Part 4 preset Sec 4 type VRT 4 P |
|
IS 8872 (Part 4/Sec 5) : 1984 Reviewed In : 2018 |
Specification for variable resistors Part 4 preset Sec 5 type VRT 5 P |
|
IS 8909 (Part 1) : 1978 Reviewed In : 2015 |
Fixed Resistors General Purpose Power - Part I General Requirements and Methods of Tests |
|
IS 8909 (Part 2) : 1978 Reviewed In : 2021 |
Specification for fixed resistors general purpose power Part 2 type FRP1 |
|
IS 8909 (Part 3) : 1978 Reviewed In : 2021 |
Specification for fixed resistors general purpose power Part 3 type FRP 2 |
|
IS 8909 (Part 4) : 1978 Reviewed In : 2021 |
Specification for fixed resistors general purpose power Part 4 type FRP 3 |
|
IS 8909 (Part 5) : 1978 Reviewed In : 2021 |
Specification for fixed resistors general purpose power Part 5 type FRP 4 |
|
IS 8943 : 1978 Reviewed In : 2020 |
Guide to the design and use of components intended for mounting on boards with printed wiring and printed circuits |
|
IS 9000 (Part 18/Sec 13) : 1981 Reviewed In : 2021 |
Basic environmental testing procedures for electronic and electrical items Part 18 solderABility test |
|
IS 9001 (Part 9) : 1981 Reviewed In : 2021 |
Guidance for environmental testing Part 9 solderABility and resistance to soldering heat |
|
IS 9256 (Part 2) : 1979 Reviewed In : 2021 |
Specification for fixed metallized polyester film dielectric capacitors Part 2 type FCPM 1 |
|
IS 9256 (Part 3) : 1979 Reviewed In : 2021 |
Specification for fixed metallized polyester film dielectric capacitors Part 3 type FCPM 2 |
|
IS 9302 (Part 1) : 1979 IEC 268-2 & 1, 1A & 1B Reviewed In : 2001 |
Characteristics and methods of measurements for sound system equipment Part 1 General |
|
IS 9302 (Part 2) : 1979 IEC 60368-3 Reviewed In : 2001 |
Characteristics and methods of measurements for sound system equipment Part 2 Amplifiers |
|
IS 9302 (Part 3) : 1981 Reviewed In : 2001 |
Characteristics and methods of measurements for sound system equipment Part 3 Microphones |
|
IS 9302 (Part 4) : 1993 Reviewed In : 2002 |
Characteristics and methods of measurements for sound systems equipment Part 4 Loudspeaker |
|
IS 9302 (Part 6) : 1986 IEC 60268-7 Reviewed In : 2001 |
Characteristics and methods of measurements for sound system equipment Part 6 Headphones and head sets |
|
IS 9302 (Part 7) : 1987 IEC 60268-8 Reviewed In : 2005 |
Characteristics and methods of measurements for sound system equipment Part 7 Automatic gain control devices |
|
IS 9302 (Part 10) : 1980 IEC 60268-15 Reviewed In : 2001 |
Characteristics and methods of measurements for sound system equipment Part 10 Preferred matching values for the inter-connection of sound system components |
|
IS 9414 (Part 1/Sec 1) : 1979 Reviewed In : 2021 |
Detail specification for digital integrated circuits Part 1 nand gate TTL Sec 1 single 8 input positive |
|
IS 9414 (Part 1/Sec 2) : 1979 Reviewed In : 2021 |
Detail specification for digital integrated circuits Part 1 nand gate TTL Sec 2 dual 4 input positive |
|
IS 9414 (Part 1/Sec 3) : 1979 Reviewed In : 2021 |
Detail specification for digital integrated circuits Part 1 nand gate TTL Sec 3 triple 3 input positive |
|
IS 9414 (Part 1/Sec 4) : 1979 Reviewed In : 2021 |
Detail specification for digital integrated circuits Part i nand gate TTL Sec 4 quad 2 input positive |
|
IS 9437 (Part 1) : 1979 Reviewed In : 2021 |
Specification for fixed precision resistors Part 1 general requirements and methods of test |
|
IS 9437 (Part 2) : 1980 Reviewed In : 2021 |
Specification for fixed precision resistors Part 2 type FRPR 1 |
|
IS 9437 (Part 3) : 1980 Reviewed In : 2021 |
Specification for fixed precision resistors indian standard Part 3 type FRPR 2 |
|
IS 9437 (Part 4) : 1980 Reviewed In : 2021 |
Specification for fixed precision resistors Part 4 type FRPR 3 |
|
IS 9470 : 1979 Reviewed In : 2018 |
Method of test for the usABility of resistors under pulse conditions |
|
IS 9501 (Part 1) : 1980 Reviewed In : 2018 |
Methods of measurement of electrical characteristics of microcircuits Part 1 digital micro circuits |
|
IS 9501 (Part 2) : 1980 Reviewed In : 2018 |
Methods of measurement of electrical characteristics of microcircuits Part 2 analogue microcircuits |
|
IS 9512 : 1980 Reviewed In : 2021 |
Guidance for pulse testing of resistors |
|
IS 9593 (Part 1) : 1980 Reviewed In : 2018 |
Specification for plastic film dielectric variable tuning capacitors grade 2 Part 1 tests and general requirements |
|
IS 9596 : 1981 Reviewed In : 2021 |
General requirements and classification of tests for micro circuits |
|
IS 9614 (Part 1) : 1980 Reviewed In : 2021 |
Specification for fixed high - Meg resistors Part 1 type FRHM 1 |
|
IS 9614 (Part 2) : 1980 Reviewed In : 2021 |
Specification for fixed high - Meg resistors Part 2 type FRHM 2 |
|
IS 9614 (Part 3) : 1980 Reviewed In : 2021 |
Specification for fixed high - Meg resistors Part 3 type FRHM 3 |
|
IS 9638 (Part 2) : 1984 Reviewed In : 2021 |
Specification for fixed polyester film dielectric capacitors for direct current Part 2 type FCPE 1 |
|
IS 9638 (Part 3) : 1985 Reviewed In : 2021 |
Specificaton for fixed polyester film dielectric capacitors for direct current Part 3 type FCPE 2 |
|
IS 9638 (Part 4) : 1984 Reviewed In : 2021 |
Specification for fixed polyester film dielectric capacitors for direct current Part 4 type FCPE 3 |
|
IS 9779 : 1981 IEC 60651 Reviewed In : 2001 |
Sound Level Meters |
|
IS 9807 : 1981 Reviewed In : 2018 |
Life testing of digital microcircuits |
|
IS 9816 : 1981 Reviewed In : 2021 |
General requirements and classification of tests for semiconductor devices |
IS/QC 001001 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components IECQ - Basic rules First Revision |
|
IS/QC 001002-2 : 2000 Reviewed In : 2024 |
IEC quality assessment system for electronic components IECQ - Rules of procedure Part 2 Documentation First Revision |
|
IS 12970 (Part 1) : 2010 Reviewed In : 2021 |
Semiconductor devices integrated circuits Part 1 general |
|
IS 12970 (Part 2) : 2021 IEC 60748-2: 1997 Reviewed In : 2024 |
Semiconductor devices - Integrated circuits Part 2 Digital integrated circuits essential ratings and characteristics Sec 1 General |
|
IS 12970 (Part 3) : 2021 IEC 60748-3: 1994 |
Semiconductor devices Integrated circuits Part 3 Analogue integrated circuits Superseding 1 IS 12970Part 5Sec 1 1991 2 IS 12970Part 5Sec 2 1992 3 IS 12970Part 5Sec 3 1992 4 IS 12970Part 5Sec 4 1992 5 IS 12970Part 5Sec 5 1993 6 IS 12970Part 5Sec |
|
IS 13247 (Part 1) : 2021 IEC 60939-1: 2010 |
Passive filter units for electromagnetic interference suppression Part 1 Generic specification First Revision and Superseding 1 IS 3723Part 1 1978 2 IS 3723Part 2 1983 and 3 IS 3723Part 3 1983 |
|
IS 13247 (Part 2) : 2021 IEC 60939-2:2005 |
Passive filter units for electromagnetic interference suppression Part 2 Sectional specification Passive filter units for which safety tests are appropriate Test methods and general requirements First Revision of IS 13247 Part 2 |
|
IS 14901 (Part 1) : 2010 IEC 60747-1: 2006 Reviewed In : 2022 |
Semiconductor devices - Discrete devices and integrated circuits Part 1 general First Revision |
|
IS 14901 (Part 2) : 2020 IEC 60747-2: 2016 |
Semiconductor Devices Part 2 Discrete Devices Rectifier Diodes First Revision |
|
IS 14901 (Part 5) : 2004 IEC 60747-5 Reviewed In : 2021 |
Semiconductor devices - Discrete devices and integrated circuits Part 5 optoelectronic devices |
|
IS 14901 (Part 7) : 2020 IEC 60747-7 : 2010 |
Semiconductor Devices Discrete Devices Part 7 Bipolar Transistors First Revision |
|
IS 14901 (Part 8) : 2020 IEC 60747-8 : 2010 |
Semiconductor Devices Discrete Devices Part 8 Field-Effect Transistors Second Revision |
|
IS 15866 (Part 1) : 2010 IEC 60938-1:2006 Reviewed In : 2021 |
Fixed inductors for electromagnetic interference suppression Part 1 generic specification |
|
IS/QC 300000 : 1988 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment generic specification |
|
IS/QC 300100 : 1988 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment Sectional specification fixed polyethrsylene - Terephthalate film dielectric metal foil DC capacitor |
|
IS/QC 300201 : 2000 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment Part 15 blank detail specification fixed tantalum capacitors with solid electrolyte and porous anode assessment level E |
|
IS/QC 300301 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification aluminium electrolytic capacitors with non - Solid electrolyte assessment level E |
|
IS/QC 300401 : 1988 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification fixed metallized polyethylene - Terephthalate film dielectric D C capacitors assessment level e |
|
IS/QC 300600 : 1993 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment - Sectional specification for fixed capacitors of ceramic dielectric class 1 |
|
IS/QC 300601 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification for fixed capacitors of ceramic dielectric class 1 assessment level E |
|
IS/QC 300700 : 1994 Reviewed In : 2018 |
Fixed capacitors for use in electronic equipment Sectional specification for fixed capacitors of ceramic dielectric class 2 |
|
IS/QC 300701 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed Capacitors for Use in Electronic Equipment Sectional Fixed Capacitors of Ceramic Dielectric Class 2 |
|
IS/QC 300800 : 1994 Reviewed In : 2020 |
Fixed capacitors for use in electronic equipment Sectional specification for fixed tantalum chip capacitors |
|
IS/QC 300801 : 1993 Reviewed In : 2020 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification for fixed tantalum chip capacitors assessment level E |
|
IS/QC 301200 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment Sectional specification for fixed metallized polypropylene film dielectric D C capacitors |
|
IS/QC 301201 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment - Blank detail specification for fixed metallized polypropylene film dielectric D C capacitors - Assessment level e |
|
IS/QC 301301 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed capacitors for use in electronic equipment blank detail specification for fixed metallized polypropylene film dielectric A C and pulse capacitors assessment level E |
|
IS/QC 301800 : 2001 Reviewed In : 2020 |
Fixed capacitors for use in electronic equipment Part 13 Secal specification fixed polypropylene film dielectric metal foil D C capacitors Sec one - General |
|
IS/QC 301801 : 2001 Reviewed In : 2020 |
Fixed capacitors for use in electronic equipment Part 13 blank detail specification fixed polypropylene film dielectric metal foil D C capacitors assessment level E |
|
IS/QC 302400 : 1994 Reviewed In : 2018 |
Fixed capacitors for use in electronic equipment Sectional specification for fixed capacitors for electromagnetic interference suppression and connection to the supply mains |
|
IS/QC 400100 : 1988 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment Sectional specification fixed low - Power non - Wire wound resistors |
|
IS/QC 400101 : 1988 Reviewed In : 2021 |
Fixed restors for use in electronic equipment blank detail specification fixed low - Power non - Wirewound resistors assessment level E |
|
IS/QC 400200 : 1992 Reviewed In : 2021 |
Fixed resistors for use in electronic equipment Sectional specification fixed power resistors |
|
IS/QC 400400 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Sectional specification for fixed resistor networks with individually measurable resistors |
|
IS/QC 400401 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Blank detail specification - Fixed resistor networks with individually measurable resistors all of equal value and equal dissipation assessment level E |
|
IS/QC 400500 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Sectional specification for fixed resistor networks in which not all resistors are individually measurable |
|
IS/QC 400501 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment - Blank detail specification for fixed resistors networks in which not all resistors are individually measurable - Assessment level E |
|
IS/QC 400600 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment Sectional specification for fixed chip resistors |
|
IS/QC 400601 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Fixed resistors for use in electronic equipment blank detail specification for fixed chip resistors assessment level E |
|
IS/QC 410100 : 1992 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Potentiometers for use in electronic equipment Sectional specification lead - Screw actuated and rotary preset potentiometers |
|
IS/QC 410101 : 1992 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Potentiometers for Use in Electronic Equipment Blank Detail Specification Lead-Screw Actuated and Rotary Preset Potentiometers Assessment Level E |
|
IS/QC 420000 : 1994 Reviewed In : 2023 |
Varistors for use in electronic equipment - Generic specification |
|
IS/QC 420100 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Varistors for use in electronic equipment -Sectional specification for surge suppression varistors |
|
IS/QC 420102 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Varistors for use in electronic equipment - Blank detail specification for zinc oxide surge suppression varistors - AsiEssment level E |
|
IS/QC 440000 : 1994 Reviewed In : 2018 |
Directly heated positive step function temperature coefficient thermistors - Generic specification |
|
IS/QC 440001 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Directly heated positive step function temperature coefficient thermistors - Blank detail specification - Assessment level E |
|
IS/IEC 60384-4 : 2016 IEC 60384-4: 2016 |
Fixed capacitors for use in electronic equipment Part 4 Sectional specification Fixed aluminium electrolytic capacitors with solid MnO2 and non-solid electrolyte Superseding IS 4317 1983 and ISQC 300300 1992 |
|
IS/IEC 60384-15 : 2017 IEC 60384-15: 2017 |
Fixed capacitors for use in electronic equipment Part 15 Sectional specification Fixed tantalum capacitors with non-solid or solid electrolyte |
|
IS/IEC 60384-141-1) : 2016 IEC 60384-14-1: 2016 |
Fixed capacitors for use in electronic equipment Part 14 Blank detail specification Fixed capacitors for electromagnetic interference suppression and connection to the supply mains Section 1 Assessment level DZ Superseding ISQC 302401 1994 |
|
IS/IEC 62326-1 : 2002 IEC 62326-1 : 2002 Reviewed In : 2024 |
Printed Boards Part 1 Generic specification |
|
IS/IEC 62326-20 : 2016 IEC 62326-20 : 2016 Reviewed In : 2024 |
Printed Boards Part 20 Printed Circuit Boards for High-Brightness LEDs |
|
IS 7305 : 2018 IEC 60384-1 : 2016 Reviewed In : 2021 |
Fixed capacitors for use in electronic equipment - Generic specification Second Revision |
|
IS/QC 760000 : 1994 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Generic specification for film integrated circuits and hybrid film integrated circuits |
|
IS/QC 760100 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure |
|
IS/QC 760101 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure |
|
IS/QC 760200 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - SectlOnal specification for film integrated circuits and hybrid film integrated circuits on the basis of the capablity approval procedures |
|
IS/QC 760201 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
|
IS/QC 790130 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for HCMOS digital integrated circuits Series 54 74 HC 54 74 HCT 54 74 HCU |
|
IS/QC 790131 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for complementary MOS digital integrated circuits Series 4000 Band 4000 Ub |
|
IS/QC 790132 : 1995 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates Excluding Uncommitted Logic Arrays |
|
IS/QC 790202 : 1993 Reviewed In : 2021 Reaffirmed but not taken up for revision |
Semiconductor devices - Integrated circuits - Analogue integrated circuits blank detail specification for monolithic integrated operational amplifiers |
|
IS 9256 (Part 1) : 2019 IEC 60384-2 : 2011 Reviewed In : 2022 |
Fixed capacitors for use in electronic equipment Part 1 Sectional specification - Fixed metallized polyethylene terephthalate film dielectric d c capacitors First Revision |
|
IS 9638 (Part 1) : 1980 Reviewed In : 2021 |
Specification for fixed polyester film dielectric capacitors for direct current Part 1 general requirements and methods of tests |