Electromagnetic Compatibility (EMC) Part 4 Testing and Measurement Techniques Section 24 Test methods for protective devices for HEMP conducted disturbance ( First Revision )
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 4 electrical fast transient / burst immunity test (Second Revision)
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 6 immunity to conducted disturbances, induced by radio - Frequency fields
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 11 voltage dips, short interruptions and voltage variations immunity tests
LITD 9
International Standards Referred In IS/CISPR 35 : 2016 CISPR 35: 2016 Reviewed In : 2024
1
IEC 61000 : 4 : 20 2010
2
ISO 9241 : 3 : 1992
3
IEC 16 : 1 : 2 2014
4
IEC 61000 : 4 : 21 2011
IS/CISPR 35 : 2016 CISPR 35: 2016 Reviewed In : 2024 is Referred in following Indian Standards :
Standard contains no Cross Referenced Indian Standard.
Classification Details
Group
:
Electronic and Telecom equipments, components and devices
Sub Group
:
Electronic equipments and systems
Sub Sub Group
:
Electromagnetic Compatibility and Electromagnetic Interference
Aspect
:
Product Specification
Certification
:
Voluntary Registration
Relevant Ministries
:
Ministry of Electronics and Information Technology
