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Basic Details/ मूल ब्यौरा
Comment
IS Number/
आईएस संख्या
:
IS 12737 : 1988
IEC 60759
Reviewed In : 2023
IS Title/
आईएस शीर्षक
:
Standard test procedures for semiconductor X - Ray energy spectrometers
Superseding IS/
सुपरसीडिंग आईएस
:
None
Degree of Equivalence/
समतुल्यता स्तर
:
Identical under dual numbering
Number of Revisions/
पुनरीक्षणों की संख्या
:
New Standard
Number of Amendments/
संशोधनों की संख्या
:
No amendment issued
Aspect/
पक्ष
:
Methods of tests
Language/
भाषा
:
English
Reaffirmation Year/
पुनर्पुष्टि वर्ष
:
July, 2023
Technical Department/
तकनीकी विभाग
:
LITD (Electronics and Information Technology Department)
Technical Committee/
तकनीकी समिति
:
LITD 08 (Electronic Measuring Instruments, Systems And Accessories Sectional Committee)
Member Secretary/
सदस्य सचिव
:
Mr. PRIYANSHU SHARMA (SCIENTIST-C)
Other Details
Indian Standard
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Amendment : 0
Gazette Document : 0
License : 0
Product Manual & SIT : 0
Laboratory : 0
Classification Details
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Cross Reference Details
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Composition
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Corrigendum : 0
Cross Reference Details
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Indian Standards Referred In IS IS 12737 : 1988
IEC 60759
Reviewed In : 2023
:
1
IS 1885 (Part 63) : 1985
IEC 60050-391(1975)
Reviewed In : 2023
Electrotechnical vocabulary: Part 63 nuclear instrumentation
LITD 8
2
IS 11425 : 1985
IEC 60333: 1983
Reviewed In : 2020
Test procedures for semiconductor charged - Particle detectors
LITD 8
3
IS 11645 : 1985
IEC 60340
Reviewed In : 2014
Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation
LITD 8
4
IS 12639 : 1988
Test Procedures for Germanium Detectors For X and Gamma Radiation
MED 32
International Standards Referred In IS 12737 : 1988
IEC 60759
Reviewed In : 2023
Standard contains no Cross Referenced International Standard.
IS 12737 : 1988
IEC 60759
Reviewed In : 2023
is Referred in following Indian Standards :
Standard contains no Cross Referenced Indian Standard.
Classification Details
Group
:
Electronic and Telecom equipments, components and devices
Sub Group
:
Electronic equipments and systems
Sub Sub Group
:
Electronic measuring instruments & weighing systems
Aspect
:
Methods of tests
Certification
:
None
Relevant Ministries
:
Sustainable development Goals :
Short Commom Man's Title
:
Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
ITC-HS Code
:
N/A
Degree of Equivalence
:
Identical under dual numbering
Identical/Equivalent International Standard(s)
:
IEC 60759
Harmonized with
:
IEC
Email Ids
ID
Mailing list
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1
Committee members email list
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3
Additional mailing list
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List of Licenses under IS : IS 12737 : 1988
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Expired or Cancelled Licenses
List of Expired or Cancelled Licenses under IS : IS 12737 : 1988
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Active Licenses
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Licence No.
Firm Name & Address
District
State
Validity Date
Status
Variety
Brand Name
Scale
ID
Licence No.
Firm Name & Address
District
State
Validity Date
Status
Variety
Brand Name
Scale
List of laboratories for : IS 12737 : 1988
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#
Lab Name
Address
City
State
Contact Number
Email Id
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List of Amendement(s) for : IS 12737 : 1988
#
Amendment Number
Amendment Year
File Name
Action
List of Gazette Document(s) for : IS 12737 : 1988
#
IS/Amendment Number
SO. No.
Action
List of Corigenda Document(s) for : IS 12737 : 1988
#
IS/Amendment Number
File Name
Action
List of Product Manuals & SIT
#
File Type
File Name
Action
Total Visitors -
7
1
3
9
2
1
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