Electromagnetic Compatibility (EMC) Part 4 Testing and Measurement Techniques Section 24 Test methods for protective devices for HEMP conducted disturbance ( First Revision )
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 4 electrical fast transient / burst immunity test (Second Revision)
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 6 immunity to conducted disturbances, induced by radio - Frequency fields
Electromagnetic compatibility (EMC): Part 4 testing and measurement techniques: Sec 11 voltage dips, short interruptions and voltage variations immunity tests
Nuclear energy — Reference beta-particle radiation — Calibration of area and personal dosemeters and the determination of their response as a function of beta radiation energy and angle of incidence
CHD 30
International Standards Referred In IS 13883 : 2023 IEC 62387 : 2020
1
IEC 61000 : 4 : 2 2008
2
IEC 61000 : 4 : 3
3
IEC 61000 : 4 : 4 2012
4
IEC 61000 : 4 : 6 2013
5
IEC 61000 : 4 : 8 2009
6
IEC 61000 : 4 : 11 2020
7
IEC 61000 : 6 : 2 2016
8
ISO 6980 : 3 : 2006
9
IEC 61000 : 4 : 5
10
ISO 4037 : 0 : 0 0
11
ISO 4037 : 3 : 2019
12
ISO 6980 : 0 : 0 0
13
ISO 8529 : 0 : 0 0
14
ISO/IEC 0 : 3 : 2008
IS 13883 : 2023 IEC 62387 : 2020 is Referred in following Indian Standards :
Standard contains no Cross Referenced Indian Standard.
Classification Details
Group
:
Electronic and Telecom equipments, components and devices
Sub Group
:
Electronic equipments and systems
Sub Sub Group
:
Electromagnetic Compatibility and Electromagnetic Interference
