IS Title/आईएस शीर्षक:
Connectors for frequencies below 3 MHz for use with printed boards Part 1: Generic specification General requirements and guide for the preparation of detail specifications, with assessed quality
Superseding IS/सुपरसीडिंग आईएस:
None
Degree of Equivalence/समतुल्यता स्तर:
Identical under single numbering
Number of Revisions/पुनरीक्षणों की संख्या:
New Standard
Number of Amendments/संशोधनों की संख्या:
No amendment issued
Aspect/पक्ष:
Code of Practice
Language/भाषा:
English
Reaffirmation Year/पुनर्पुष्टि वर्ष:
No reaffirmation
Technical Department/तकनीकी विभाग:
LITD (Electronics and Information Technology Department)
Technical Committee/तकनीकी समिति:
LITD 03 (Electromechanical Components And Mechanical Structures For Electronic--equipment Sectional Committee)
Member Secretary/सदस्य सचिव:
MS. ALISMITA KHAG (SCIENTIST-C)
Basic testing procedures and measuring methods for electrotechnical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 1 general examination
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 2 electrical continuity and contact resistance tests
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 3 insulation tests
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 2 general examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests: Sec 4 voltage stress tests
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 7 mechanical operating tests and sealing tests
Basic testing procedures and measuring methods for electromechanical components for electronic equipment: Part 8 connector tests (Mechanical) and mechanical tests on contacts and terminations
LITD 3
International Standards Referred In IS/IEC 60603-1 : 1991 60603-1 : 1991
1
IEC 60050 : 581 : 2008
2
ISO 286 : 1 : 1988
3
ISO 286 : 2 : 1988
4
ISO 1000 : 1981
IS/IEC 60603-1 : 1991 60603-1 : 1991 is Referred in following Indian Standards :