Document Details |
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| Name of Department/Committee : | MTD 33 |
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| Document Number : | MTD 33 ( 24994) |
| Document Title [English] : | Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification |
| Document Title [Hindi] : | माइक्रोबीम विश्लेषण ― स्कैनिंग इलेक्ट्रॉन माइक्रोस्कोपी ― छवि आवर्धन को कैलिब्रेट करने के लिए दिशानिर्देश |
| Document Type : | New |
| Language : | English |
| Priority : | 3 |
| ICS Code : | 37.020 |
| Date of Project Approval : | 29-12-2023 |
| Standards to be Superseded : | |
Classification Details |
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| Group : | Metals, Alloys and Metal Products (including Steel Products) |
| Sub Group : | Nano-Technology |
| Sub Sub Group : | Nanotechnology for medical devices |
| Aspects : | Code of Practice |
| Risk : | None |
| Certification : | Not Certifiable |
| Short Commom Man's Title : | |
| ITCHS Code : | |
| Ministry : |
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| Sustainable development Goals : | |
| Degree of Equivalence : | Identical under dual numbering |
| Identical/Equivalent Standards : | ISO 16700 : 2016 |
| Organization Type: | ISO |
| Sl.No. | Synosis Points | |
| 1 | The scanning electron microscope is widely used to investigate the surface structure of a range of important materials such as semiconductors, metals, polymers, glass, food and biological materials, and this International Standard is relevant to the need for magnification calibration of the images. It describes the requirements for calibration of the image magnification in the scanning electron microscope using a reference material or a certified reference material. | |
Timeline Details |
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Stages |
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| Sl. No. |
Stage | Date of Occurence | Remarks | Circulated to | Files |
| 1 | Generation of Document Number | 29-12-2023 | ------- | ||
| 2 | P-Draft Waived | 05-03-2024 | ISO Adoption | ------- | |
| 3 | WC Draft | 05-03-2024 | Duration : 31 Days Submitted for HOD approval |
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| 4 | WC Draft | 05-03-2024 | WC rejected by HOD Remarks: Please discuss |
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