Document Details |
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| Name of Department/Committee : | LITD 02 |
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| Document Number : | LITD 02 ( 23166) |
| Document Title [English] : | Reliability growth Stress testing for early failures in unique complex systems |
| Document Title [Hindi] : | Reliability growth – Stress testing for early failures in unique complex systems |
| Document Type : | New |
| Language : | English |
| Priority : | 3 |
| ICS Code : | 03.120.01; 03.120.99 |
| Date of Project Approval : | 01-05-2023 |
| Standards to be Superseded : | |
Classification Details |
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| Group : | Electronic and Telecom equipments, components and devices |
| Sub Group : | Electronic components and devices |
| Sub Sub Group : | Reliability of Electronic and Electrical items |
| Aspects : | Code of Practice |
| Risk : | None |
| Certification : | None |
| Short Commom Man's Title : | |
| ITCHS Code : | |
| Ministry : |
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| Sustainable development Goals : |
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| Degree of Equivalence : | Identical under single numbering |
| Identical/Equivalent Standards : | IEC 62429:2007 |
| Organization Type: | IEC |
| Sl.No. | Synosis Points | |
| 1 | This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique” means that no information exists on similar systems, and the small number of produced systems means that information deducted from the test has limited use for future production. | |
| 2 | This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It can be used for describing the procedure for acceptance testing, "running-in", and to ensure that reliability of a delivered system is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constant failure period, nor the wear out failure period. It can also be used when a company wants to optimize the duration of internal production testing during manufacturing of prototypes, single systems or small series. | |
| 3 | If the user of a system performs reliability growth by a policy of updating hardware and software with improved versions, this standard can be used to guide the growth process. This standard covers a wide field of applications, but is not applicable to health or safety aspects of systems. This standard does not apply to systems that are covered by IEC 62279[39]. | |
Timeline Details |
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Stages |
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| Sl. No. |
Stage | Date of Occurence | Remarks | Circulated to | Files |
| 1 | Generation of Document Number | 01-05-2023 | ------- | ||
| 2 | P-Draft Waived | 11-08-2023 | IEC Standard is available hence P-draft is waived off | ------- | |
| 3 | WC Draft | 14-08-2023 | Duration : 60 Days Submitted for HOD approval |
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| 4 | WC Draft | 14-08-2023 | WC approved by HOD |
LITDC | ------- |
| 5 | WC-Draft | 25-08-2023 | WC-Draft Email Notifications Sent | LITDC, LITD 2, | ------- |