Document Details |
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Name of Department/Committee : | LITD 02 |
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Document Number : | LITD 02 ( 23128) |
Document Title [English] : | Weibull Analysis |
Document Title [Hindi] : | Weibull Analysis |
Document Type : | New |
Language : | English |
Priority : | 3 |
ICS Code : | 03.120.01; 03.120.30 |
Date of Project Approval : | 01-05-2023 |
Standards to be Superseded : |
Classification Details |
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Group : | Electronic and Telecom equipments, components and devices |
Sub Group : | Electronic components and devices |
Sub Sub Group : | Reliability of Electronic and Electrical items |
Aspects : | Code of Practice |
Risk : | None |
Certification : | None |
Short Commom Man's Title : | |
ITCHS Code : | |
Ministry : |
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Sustainable development Goals : |
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Degree of Equivalence : | Identical under single numbering |
Identical/Equivalent Standards : | IEC 61649:2008 |
Organization Type: | IEC |
Sl.No. | Synosis Points | |
1 | This International Standard provides methods for analyzing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is applicable whenever data on strength parameters, e.g. times to failure, cycles, stress, etc. are available for a random sample of items operating under test conditions or in-service, for the purpose of estimating measures of reliability performance of the population from which these items were drawn. | |
2 | This standard is applicable when the data being analysed are independently, identically distributed. This should either be tested or assumed to be true (see IEC 60300-3-5). In this standard, numerical methods and graphical methods are described to plot data, to make a goodness-of-fit test, to estimate the parameters of the two- or three-parameter Weibull distribution and to plot confidence limits. Guidance is given on how to interpret the plot in terms of risk as a function of time, failure modes and possible weak population and time to first failure or minimum endurance. |
Timeline Details |
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Stages |
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Sl. No. |
Stage | Date of Occurence | Remarks | Circulated to | Files |
1 | Generation of Document Number | 01-05-2023 | ------- | ||
2 | P-Draft Waived | 03-08-2023 | IEC Standard available hence committee decided to way off P-Draft. | ------- | |
3 | WC Draft | 14-08-2023 | Duration : 60 Days Submitted for HOD approval |
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4 | WC Draft | 14-08-2023 | WC approved by HOD |
LITDC | ------- |
5 | WC-Draft | 25-08-2023 | WC-Draft Email Notifications Sent | LITDC, LITD 2, | ------- |