| S.No | Document Number | Document Title | Doc Type | Priority | Language | Document Stage | Last Action Date |
|---|---|---|---|---|---|---|---|
| 1 |
MTD/33/24994 (Identical To: ISO 16700 : 2016) |
Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification | New | 3 | English | WC-Draft | 05-03-2024 |
| 2 |
MTD/33/26077 IS 17003 : Part 1: 2022 (Identical To: ISO 80004-1 : 2023) |
Nanotechnologies Vocabulary Part 1: Core Vocabulary | Revision | 3 | English | PDF Sent To Technical Department | 25-10-2024 |